・High light intensity irradiating optical system exceeding 2 μW
・Low-energy irradiating optical system capable of measurements from 2 eV
・High-temperature measurements up to 100 °C
・Film thickness measurements
・Precise measurements in 0.01 eV increments
・Includes often-requested multi-point measurement and repeated measurement functions
・Imports and analyzes AC-2/3/5 data
・Uses flat-plate open counter enabling photoelectron count rates of up to 4,000 cps